Taught by Fr. Matthys, Professor of Physics and EECE.
Aimed at Engineering students, especially those in MEEN and INEN.
Course is listed in different departments: PHYS 198, MEEN 159, INEN 159.
Course can be taken for graduate credit (project involved).
Offered in Spring 1997 semester with Lectures on MW at 4:20-5:35pm
Pre-requisites: Optics as covered in Phys 4, Math at level of Fourier Analysis
Textbook: G. Cloud, "Optical Methods of Engineering Analysis," Cambridge Press, 1995.
1. Photoelasticity
Measurement of stress using birefringence
2. Moire fringes
In-plane displacements
Surface contouring by shadow and projection moire
3. Holographic Interferometry
In-plane and out-of-plane measurements
The Sign problem - spatial and temporal carrier patterns
Phase unwrapping
4. Speckle Pattern Measurements
Speckle photography : Data reduction using Young's fringes, Fourier filtering, correlation methods
Speckle interferometry (Electronic Speckle Pattern Interferometry, ESPI)
Because of limited hardware, the lab component will consist of in-class optical setups and digital image acquisition. Students will then be given a set of the acquired images and will have to perform independent numerical analyses.
Last modified on April 20, 1997